Near-field scanning microwave microscope using a dielectric resonator

Applied Physics Letters

Volumn 83, Issue 5, 2003, Pages 1032-1034

  Kim, Jooyoung ^a   Lee, Kiejin ^a   Friedman, Barry ^b   Cha, Deokjoon ^c  

^a Sogang University   (South Korea)

^b SAM HOUSTON STATE UNIVERSITY   (United States)

^c Kunsan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; IMPEDANCE MATCHING (ELECTRIC); LIGHT REFLECTION; METALLIC FILMS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTICAL RESONATORS; THICKNESS MEASUREMENT; THIN FILM DEVICES;

MICROWAVE MICROSCOPES;

MICROWAVE DEVICES;

EID: 0041375655     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1597984     Document Type: Article

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