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Volumn 162, Issue 4, 1999, Pages 177-181
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Electromagnetic fields in the cutoff regime of tapered metallic waveguides
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Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
MAXWELL EQUATIONS;
OPTICAL MICROSCOPY;
WAVEGUIDES;
SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);
TAPERED METAL CUTOFF WAVEGUIDES;
ELECTROMAGNETIC FIELD THEORY;
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EID: 0032648120
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(99)00094-2 Document Type: Article |
Times cited : (38)
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References (12)
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