Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach

Applied Physics Letters

Volumn 84, Issue 23, 2004, Pages 4647-4649

  Gao, Chen ^a   Hu, Bo ^a   Zhang, Pu ^a   Huang, Mengming ^a   Liu, Wenhan ^a   Takeuchi, I ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC THIN FILMS; QUANTITATIVE MICROWAVE EVANESCENT MICROSCOPY; RECURSIVE IMAGE CHARGE APPROACH;

ALGORITHMS; APPROXIMATION THEORY; BOUNDARY CONDITIONS; CHEMICAL ANALYSIS; DIELECTRIC FILMS; DIELECTRIC WAVEGUIDES; ELECTRIC CHARGE; FINITE ELEMENT METHOD; PERMITTIVITY; RESONATORS;

THIN FILMS;

EID: 3042682772     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1759389     Document Type: Article

References (10)

1. T. Wei, X.-D. Xiang, W. G. Wallace-Freedman, and P. G. Schultz, Appl. Phys. Lett. 68, 3506 (1996).
2. M. Abu-Teir, M. Golosovsky, D. Davidov, A. Frenkel, and H. Goldberger, Rev. Sci. Instrum. 72, 2073 (2001).
3. L. Liu, Y. J. Feng, L. Y. Wu, Q. G. Liu, E. H. Zhao, Z. L. Fu, L. Kang, S. Z. Yang, and P. H. Wu, Solid State Commun. 119, 133 (2001).
4. C. Gao and X.-D. Xiang, Rev. Sci. Instrum. 69, 3846 (1998).
5. F. Duewer, C. Gao, I. Takeuchi, and X.-D. Xiang, Appl. Phys. Lett. 74, 2696 (1999).
6. J. H. Lee, S. Hyun, and K. Char, Rev. Sci. Instrum. 72, 1425 (2001).
7. D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood, S. M. Anlage, C. Canedy, R. Ramesh, A. Stainshevsky, and J. Melngailis, Rev. Sci. Instrum. 71, 2751 (2000).
8. H.-F. Cheng, Y.-C. Chen, G. Wang, X.-D. Xiang, G.-Y. Chen, K. S. Liu, and I.-N. Lin, J. Eur. Ceram. Soc. 23, 2667 (2003).
9. A. V. Aho, J. D. Ullman, and J. E. Hopcroft, Data Structures and Algorithms (Addison-Wesley, Reading, MA, 1983).
10. C. Gao, T. Wei, F. Duewer, Y. Lu, and X.-D. Xiang, Appl. Phys. Lett. 71, 1872 (1997).