Influence of metal roughness on the near-field generated by an aperture/apertureless probe

Journal of Microscopy

Volumn 205, Issue 2, 2002, Pages 147-152

  Martin, O J F ^a   Paulus, M ^a,b  

^a ETH ZURICH   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Aperture probe; Apertureless probe; Contrast mechanisms; Image formation; Local probe microscopy; Near field optics; Numerical simulation; Scattering probe; Surface roughness

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; PROBES;

APERTURE PROBES; APERTURELESS PROBES; CONTRAST MECHANISM; LOCAL PROBE MICROSCOPY; LOCAL PROBES; NEAR FIELD OPTICS; NEAR FIELDS; NEAR-FIELD DISTRIBUTION; PROBE MICROSCOPY; SCATTERING PROBE;

SURFACE ROUGHNESS;

ALUMINUM; METAL;

ARTICLE; POLARIZATION; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0036119187     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.0022-2720.2001.00979.x     Document Type: Article

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