Nanostructured probes for scanning near-field optical microscopy

Nanotechnology

Volumn 10, Issue 1, 1999, Pages 61-64

  Drews, D ^a   Ehrfeld, W ^a   Lacher, M ^a   Mayr, K ^a   Noell, W ^a   Schmitt, S ^a   Abraham, M ^b  

^a INSTITUT FÜR MIKROTECHNIK MAINZ GMBH   (Germany)

^b NanoPhotonics AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODES; METALLIC FILMS; MICROMACHINING; MICROSENSORS; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; PROBES; SILICON NITRIDE; THIN FILMS;

NANOSTRUCTURED PROBES; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);

NANOTECHNOLOGY;

EID: 0032677085     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/10/1/012     Document Type: Article

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