Near-field microwave microscope with improved sensitivity and spatial resolution

Review of Scientific Instruments

Volumn 74, Issue 6, 2003, Pages 3167-3170

  Tselev, Alexander ^a,b   Anlage, Steven M ^a   Christen, Hans M ^c   Moreland, Robert L ^d   Talanov, Vladimir V ^b,d   Schwartz, Andrew R ^d  

^a Bldg 142   (United States)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d Neocera Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT MODULATION; RADIATION; SIGNAL TO NOISE RATIO;

SPATIAL RESOLUTION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0037772581     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571954     Document Type: Article

References (19)

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