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Applied Physics Letters

Volumn 84, Issue 4, 2004, Pages 637-639

Scanning near-field infrared microscopy based on tapered silver-halide probes

(4) Ephrat, P a Roodenko, K a Nagli, L a Katzir, A a

a TEL AVIV UNIVERSITY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; EVAPORATORS; GLASS; INFRARED RADIATION; LIGHT TRANSMISSION; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPACITY; OPTICAL COLLIMATORS; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; PROBES; RADIOMETRY; SCANNING; SILVER COMPOUNDS; TRANSPARENCY; VACUUM;

MIDINFRARED ILLUMINATION; SPATIAL RESOLUTION;

FIBER OPTIC COMPONENTS;

EID: 1242307296 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1644032 Document Type: Article

Times cited : (31)

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