Scanning near-field optical microscopy with aperture probes: Fundamentals and applications

Journal of Chemical Physics

Volumn 112, Issue 18, 2000, Pages 7761-7774

  Hecht, Bert ^a   Sick, Beate ^a   Wild, Urs P ^a   Deckert, Volker ^a   Zenobi, Renato ^a   Martin, Olivier J F ^a   Pohl, Dieter W ^b  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000627596     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.481382     Document Type: Article

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