|
Volumn 76, Issue 23, 2000, Pages 3478-3480
|
Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000069786
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.126683 Document Type: Article |
Times cited : (119)
|
References (17)
|