Theoretical and experimental characterization of a near-field scanning microwave (NSMM)

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 1 I, 2003, Pages 91-99

  Symons III, W Charles ^a   Whites, Keith W ^b   Lodder, Robert A ^c  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b South Dakota School of Mines and Technology   (United States)

^c University of Kentucky   (United States)

Author keywords

Finite difference time domain (FDTD) method; Moment method (MM); Near field imaging; Near field scanning microscopy; Near field scanning microwave microscope (NSMM); Near field scanning optical microscope (NSOM); Thin wires

Indexed keywords

FINITE DIFFERENCE METHOD; FOCUSING; LIGHT SCATTERING; MATHEMATICAL MODELS; METHOD OF MOMENTS; TIME DOMAIN ANALYSIS;

NEAR FIELD IMAGING; NEAR FIELD SCANNING MICROWAVE MICROSCOPE; THIN WIRES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0037251038     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.806915     Document Type: Article

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