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Volumn 73, Issue 19, 1998, Pages 2832-2834

Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers

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EID: 21944445641     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122605     Document Type: Article
Times cited : (47)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.