Cantilever probes for spatio-temporal imaging of voltage pulses with an ultrafast scanning probe microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 1, 2001, Pages 107-110

  Oesterschulze, E ^a   Heisig, S ^a   Steffens, W M ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LASER MODE LOCKING; PHOTOCONDUCTING DEVICES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE MODE FIBERS; SPATIAL VARIABLES MEASUREMENT; ULTRAFAST PHENOMENA; WAVEGUIDES;

SPATIO TEMPORAL IMAGING; ULTRAFAST SCANNING PROBE MICROSCOPE;

INTEGRATED OPTOELECTRONICS;

EID: 0035078349     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1330262     Document Type: Article

References (8)

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