The nanoscilloscope: Combined topography and AC field probing with a micromachined tip

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 6, 1996, Pages 4144-4147

  Van Der Weide, D W ^a   Neuzil, P ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000436182     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588608     Document Type: Article

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