High-frequency near-field microscopy

Review of Scientific Instruments

Volumn 73, Issue 7, 2002, Pages 2505-

  Rosner, Björn T ^a,b   Van Der Weide, Daniel W ^a  

^a University of Wisconsin Madison   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036639754     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1482150     Document Type: Review

References (0)