Dynamic SIMS

Surface Analysis - The Principal Techniques: Second Edition

Volumn , Issue , 2009, Pages 207-268

  McPhail, David ^a   Dowsett, Mark ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Areas and methods of application; Dynamic secondary ion mass (SIM) spectrometry; Instrumentation; Novel approaches; Quantification of data; SIMS powerful mass spectrometric technique

Indexed keywords

EID: 84890613168     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470721582.ch5     Document Type: Chapter

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