Estimation of useful yield in surface analysis using single photon ionisation

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 244-247

  King, B V ^b   Pellin, M J ^a   Moore, J F ^a   Veryovkin, I V ^a   Savina, M R ^a   Tripa, C E ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NONE

Author keywords

Laser desorption; Postionisation; SAM; SIMS; Useful yield

Indexed keywords

DESORPTION; EXCIMER LASERS; LASER APPLICATIONS; PHOTOIONIZATION; PHOTONS; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY;

FRAGMENTATION; LASER DESORPTION PHOTOIONIZATION (LDPI);

SURFACE PHENOMENA;

EID: 3543005116     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00636-0     Document Type: Conference Paper

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