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Volumn 132, Issue 2-4, 2000, Pages 243-257

Dynamic SIMS: Quantification at all depths?

Author keywords

Depth profiling; Quantification; SIMS

Indexed keywords


EID: 24044474193     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (23)

References (32)
  • 28
    • 24944457174 scopus 로고    scopus 로고
    • Ph.D Thesis (Münster University, 1997) G. Gillen, R. Lareau, J. Bennet, F. Stevie (Eds.) John Wiley & Sons, Chichester
    • K. Iltgen, Ph.D Thesis (Münster University, 1997) Proc. SIMS XI. In: G. Gillen, R. Lareau, J. Bennet, F. Stevie (Eds.) John Wiley & Sons, Chichester, 1998, p. 305.
    • (1998) Proc. SIMS XI , pp. 305
    • Iltgen, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.