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Volumn 41, Issue 3, 2006, Pages 873-903

Applications of Secondary Ion Mass Spectrometry (SIMS) in materials science

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SUPERCONDUCTING MATERIALS; SURFACE PROPERTIES;

EID: 33644549192     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10853-006-6568-x     Document Type: Article
Times cited : (124)

References (66)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.