Characterisation of thin film superconducting multilayers and their interfaces using secondary ion mass spectrometry

Journal of Alloys and Compounds

Volumn 251, Issue 1-2, 1997, Pages 355-359

  Montgomery, N J ^a   MacManus Driscoll, J L ^a   McPhail, D S ^a   Moeckly, B ^b   Char, K ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b Conductus Inc ^*  (United States)

Author keywords

Secondary ion mass spectrometry; Superconducting multilayers; Thin film

Indexed keywords

DIFFUSION IN SOLIDS; FILM GROWTH; INTERFACES (MATERIALS); ION BEAMS; ION BOMBARDMENT; LANTHANUM COMPOUNDS; MULTILAYERS; OXIDE SUPERCONDUCTORS; SECONDARY ION MASS SPECTROMETRY; XENON; YTTRIUM COMPOUNDS;

LANTHANUM ALUMINUM OXIDE; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0031124733     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(96)02810-1     Document Type: Article

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