Use of post-ionisation techniques to complement SIMS analysis. A review with practical aspects

High Temperature Materials and Processes

Volumn 17, Issue 1, 1998, Pages 29-44

  Mathieu, H J ^a   Leonard D ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

LASER APPLICATIONS; SECONDARY ION MASS SPECTROMETRY;

POST IONIZATION TECHNIQUES;

IONIZATION;

EID: 0031652548     PISSN: 03346455     EISSN: None     Source Type: Journal    
DOI: 10.1515/HTMP.1998.17.1-2.29     Document Type: Review

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