The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays

Semiconductor Science and Technology

Volumn 26, Issue 3, 2011, Pages

  Jeong, Jae Kyeong ^a  

^a Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE MATRIX DISPLAYS; ACTIVE MATRIXES; BACKPLANE ELECTRONICS; BIAS THERMAL STRESS; CHANNEL MATERIALS; DEGRADATION MECHANISM; ELECTRICAL INSTABILITY; GATE INSULATOR; HIGH-K DIELECTRIC MATERIALS; LOW RESISTANCE; METAL OXIDES;

CONTACTS (FLUID MECHANICS); DEGRADATION; DIELECTRIC MATERIALS; ELECTRONIC EQUIPMENT; FLEXIBLE DISPLAYS; LIGHT EMITTING DIODES; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; METALLIC COMPOUNDS; OHMIC CONTACTS; ORGANIC LIGHT EMITTING DIODES (OLED);

THIN FILM TRANSISTORS;

EID: 79951993680     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/26/3/034008     Document Type: Article

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