SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 21, Issue 38-39, 2009, Pages 3859-3873

Reliability of organic field-effect transistors

(1) Sirringhaus, Henning a,b

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b Plastic Logic Ltd (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS STRESS; DEVICE CHARACTERISTICS; DUTY CYCLES; ELECTRONIC DISORDER; ENVIRONMENTAL CONDITIONS; EXTRINSIC FACTORS; INTRINSIC FACTORS; LIGHT EXPOSURE; MATERIAL SYSTEMS; MICROSCOPIC DEFECTS; OPERATIONAL STABILITY; ORGANIC FIELD-EFFECT TRANSISTORS; ORGANIC SEMICONDUCTOR; ORGANIC SEMICONDUCTOR FILMS; STRESS VOLTAGES;

CHARGE TRAPPING; GATE DIELECTRICS; GATES (TRANSISTOR); SEMICONDUCTING ORGANIC COMPOUNDS;

FIELD EFFECT TRANSISTORS;

EID: 70350339679 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200901136 Document Type: Review

Times cited : (564)

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