External compensation of non-uniform electrical characteristics of thin-film transistors and degradation of OLED devices in AMOLED displays

IEEE Electron Device Letters

Volumn 30, Issue 4, 2009, Pages 377-379

  In, Hai Jung ^a   Kwon, Oh Kyong ^a  

^a Hanyang University   (South Korea)

Author keywords

Degradation; External compensation; Organic light emitting diode (OLED); Polycrystalline silicon thin film transistor (TFT)

Indexed keywords

ACTIVE-MATRIX OLED; AM-OLED; COMPENSATION METHODS; ELECTRICAL CHARACTERISTICS; EXTERNAL COMPENSATION; IMAGE STICKING; NON-UNIFORM; ORGANIC LIGHT-EMITTING; ORGANIC LIGHT-EMITTING DIODE (OLED); POLYCRYSTALLINE-SILICON THIN-FILM TRANSISTOR (TFT);

CURRENT DENSITY; DEGRADATION; DIODES; HELMET MOUNTED DISPLAYS; LIGHT EMISSION; LIGHT EMITTING DIODES; PIXELS; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; THIN FILM DEVICES; THIN FILM TRANSISTORS; TRANSISTORS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 67349160462     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2014885     Document Type: Article

References (7)

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