Bias-stress induced instability of organic thin film transistors

Synthetic Metals

Volumn 102, Issue 1-3, 1999, Pages 998-999

  Matters, M ^a   de Leeuw, D M ^a   Herwig, P T ^a   Brown, A R ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; CHARGE TRANSFER; DEGRADATION; ELECTRIC FIELD EFFECTS; ELECTRIC VARIABLES MEASUREMENT; INTERFACES (MATERIALS); RELAXATION PROCESSES; SEMICONDUCTING ORGANIC COMPOUNDS; TEMPERATURE;

BIAS STRESS INDUCED INSTABILITY; POLYTHIENYLENE VINYLENE; REVERSIBLE CHARGE RELAXATION EFFECTS; THRESHOLD VOLTAGE SHIFT;

THIN FILM TRANSISTORS;

EID: 0033137903     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01162-X     Document Type: Article

References (12)

1. G. Horowitz Adv. Mater. 10 1998 365
2. A.R. Brown C.P. Jarrett D.M. de Leeuw M. Matters Synth. Met. 88 1997 37
3. S.F. Nelson Y.Y. Lin D.J. Gundlach T.N. Jackson Appl. Phys. Lett. 72 1998 1854
4. H. Sirringhaus N. Tessler R.H. Friend Science 280 1998 1741
5. (to be published) M. Matters D.M. de Leeuw M.J.C.M. Vissenberg C.M. Hart P.T. Herwig T. Geuns C.M.J. Mutsaers C.J. Drury Optical Materials Proceedings of the E-MRS 1998
6. S.M. Sze Physics of Semiconductor Devices 1981 John Wiley & Sons Boca Raton
7. D.M. Taylor H.L. Gomes A.E. Underhill S. Edge P.I. Clemenson J. Phys. D:Appl. Phys. 24 1991 2032
8. M.J. Powell Appl. Phys. Lett. 43 1983 597
9. G. Fortunato L. Mariucci C. Reita Appl. Phys. Lett. 59 1991 826
10. F.R. Libsch J. Kanicki Appl. Phys. Lett. 62 1993 1286
11. C. van Berkel J. Kanicki Amorphous & Microcrystalline Semiconductor Devices 1992 Artech House New York,
12. W.B. Jackson J.M. Marshall M.D. Moyer Phys. Rev. B 39 1989 1164