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Journal of Applied Physics

Volumn 101, Issue 12, 2007, Pages

Low threshold voltage ZnO thin film transistor with a Zn 0.7Mg0.3O gate dielectric for transparent electronics

(2) Dhananjay, a Krupanidhi, S B a

a INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; GATE DIELECTRICS; HYSTERESIS; MAGNETRON SPUTTERING; THRESHOLD VOLTAGE; ZINC OXIDE;

CAPACITANCE-VOLTAGE (C-V) CHARACTERISTICS; OXIDE TRAPS; TRANSMITTANCE; TRANSPARENT ELECTRONICS;

THIN FILM TRANSISTORS;

EID: 34547453761 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2748863 Document Type: Article

Times cited : (60)

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