The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors

Applied Physics Letters

Volumn 95, Issue 23, 2009, Pages

  Lee, Kwang Hee ^a   Jung, Ji Sim ^a   Son, Kyoung Seok ^a   Park, Joon Seok ^a   Kim, Tae Sang ^a   Choi, Rino ^b   Jeong, Jae Kyeong ^b   Kwon, Jang Yeon ^a   Koo, Bonwon ^a   Lee, Sangyun ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HUMID ENVIRONMENT; INDIUM ZINC OXIDES; NEGATIVE BIAS; NEGATIVE V; PHOTON IRRADIATION; THERMAL INSTABILITIES;

GALLIUM; GATE DIELECTRICS; GATES (TRANSISTOR); INDIUM; MOISTURE; THIN FILM TRANSISTORS; THIN FILMS; ZINC; ZINC OXIDE;

PHOTONS;

EID: 71949092733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3272015     Document Type: Article

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