Light effects on the bias stability of transparent ZnO thin film transistors

ETRI Journal

Volumn 31, Issue 1, 2009, Pages 62-63

  Shin, Jae Heon ^a   Lee, Ji Su ^a   Hwang, Chi Sun ^a   Park, Sang Hee Ko ^a   Cheong, Woo Seok ^a   Ryu, Minki ^a   Byun, Chun Won ^a   Lee, Jeong Ik ^a   Chu, Hye Yong ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Bias stability; Light effect; Thin film transistor (TFT); Transparent oxide semiconductor; ZnO

Indexed keywords

BIAS STABILITY; LIGHT EFFECT; THIN FILM TRANSISTOR (TFT); TRANSPARENT OXIDE SEMICONDUCTOR; ZNO;

CHARGE TRAPPING; ELECTRIC CONDUCTIVITY; METALLIC FILMS; OPTICAL FILMS; SEMICONDUCTING ZINC COMPOUNDS; STABILITY; THIN FILMS; ZINC OXIDE;

THIN FILM TRANSISTORS;

EID: 61349167819     PISSN: 12256463     EISSN: None     Source Type: Journal    
DOI: 10.4218/etrij.09.0208.0266     Document Type: Article

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