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Applied Physics Letters

Volumn 95, Issue 23, 2009, Pages

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(3) Liu, Po Tsun a Chou, Yi Teh a Teng, Li Feng a

a NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BACK CHANNELS; BIAS STRESS; DYNAMIC EQUILIBRIA; GATE-BIAS STRESS; INDIUM ZINC OXIDES; INITIAL VALUES; METASTABILITIES; STRESS VOLTAGES; THRESHOLD VOLTAGE SHIFTS;

INDIUM; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE; VACUUM; ZINC; ZINC OXIDE;

PASSIVATION;

EID: 71949116567 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3272016 Document Type: Article

Times cited : (229)

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