-
1
-
-
0003759821
-
-
See for example, Bristol: IOP Publishing
-
See for example, Hartnagel H.L., Dawar A.L., Jain A.K., Jagadish C. Semiconducting transparent thin films. 1995;IOP Publishing, Bristol.
-
(1995)
Semiconducting Transparent Thin Films
-
-
Hartnagel, H.L.1
Dawar, A.L.2
Jain, A.K.3
Jagadish, C.4
-
3
-
-
0031209786
-
-
Zu P., Tang Z.K., Wong G.K.L., Kawasaki M., Ohtomo A., Koinuma K., et al. Solid-State Commun. 103:1997;459.
-
(1997)
Solid-state Commun.
, vol.103
, pp. 459
-
-
Zu, P.1
Tang, Z.K.2
Wong, G.K.L.3
Kawasaki, M.4
Ohtomo, A.5
Koinuma, K.6
-
4
-
-
2542422532
-
-
Bagnall D.M., Chen Y.R., Zhu Z., Yao T., Koyama S., Shen M.Y., et al. Appl. Phys. Lett. 70:1997;2230.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2230
-
-
Bagnall, D.M.1
Chen, Y.R.2
Zhu, Z.3
Yao, T.4
Koyama, S.5
Shen, M.Y.6
-
5
-
-
0033601559
-
-
Wraback M., Shen H., Liang S., Gorla C.R., Lu Y. Appl. Phys. Lett. 74:1999;507.
-
(1999)
Appl. Phys. Lett.
, vol.74
, pp. 507
-
-
Wraback, M.1
Shen, H.2
Liang, S.3
Gorla, C.R.4
Lu, Y.5
-
9
-
-
0001379015
-
-
Look D.C., Reynolds D.C., Hemsky J.W., Jones R.L., Sizelove J.R. Appl. Phys. Lett. 75:1999;811.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 811
-
-
Look, D.C.1
Reynolds, D.C.2
Hemsky, J.W.3
Jones, R.L.4
Sizelove, J.R.5
-
11
-
-
0012043779
-
-
Auret F.D., Goodman S.A., Hayes M., Legodi M.J., van Laarhoven H.A., Look D.C. Appl. Phys. Lett. 80:2002;956.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 956
-
-
Auret, F.D.1
Goodman, S.A.2
Hayes, M.3
Legodi, M.J.4
Van Laarhoven, H.A.5
Look, D.C.6
-
12
-
-
79956005526
-
-
Kucheyev S.O., Bradley J.E., Williams J.S., Jagadish C., Swain M.V. Appl. Phys. Lett. 80:2002;956.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 956
-
-
Kucheyev, S.O.1
Bradley, J.E.2
Williams, J.S.3
Jagadish, C.4
Swain, M.V.5
-
14
-
-
0033601559
-
-
Wraback M., Shen H., Liang S., Gorla C.R., Lu Y. Appl. Phys. Lett. 76:1999;507.
-
(1999)
Appl. Phys. Lett.
, vol.76
, pp. 507
-
-
Wraback, M.1
Shen, H.2
Liang, S.3
Gorla, C.R.4
Lu, Y.5
-
18
-
-
0001102118
-
-
Gorla C.R., Emanetoglu N.W., Liang S., Mayo W.E., Lu Y., Wraback M., et al. J. Appl. Phys. 85:1999;2595.
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 2595
-
-
Gorla, C.R.1
Emanetoglu, N.W.2
Liang, S.3
Mayo, W.E.4
Lu, Y.5
Wraback, M.6
-
19
-
-
0001260536
-
-
Ohta H., Kawamura K., Orita M., Hirano M., Sarukura N., Hosono H. Appl. Phys. Lett. 77:2000;475.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 475
-
-
Ohta, H.1
Kawamura, K.2
Orita, M.3
Hirano, M.4
Sarukura, N.5
Hosono, H.6
-
21
-
-
0012079465
-
-
Krishnamoorthy S., Iliadis A.A., Inumpudi A., Choopun S., Vispute R.D., Venkatesan T. Solid-State Electron. 46:2002;1631.
-
(2002)
Solid-state Electron.
, vol.46
, pp. 1631
-
-
Krishnamoorthy, S.1
Iliadis, A.A.2
Inumpudi, A.3
Choopun, S.4
Vispute, R.D.5
Venkatesan, T.6
-
22
-
-
1242298346
-
-
Li Y., Tompa G.S., Liang S., Gorla C., Lu C., Doyle J. J. Vac. Sci. Techol. A. 15:1997;1663.
-
(1997)
J. Vac. Sci. Techol. A
, vol.15
, pp. 1663
-
-
Li, Y.1
Tompa, G.S.2
Liang, S.3
Gorla, C.4
Lu, C.5
Doyle, J.6
-
23
-
-
6444238136
-
-
See, for example, the discussion at http://ncsr.csci-va.com/materials/ zno.asp.
-
-
-
-
27
-
-
0037185576
-
-
Hofmann D.M., Hofstaetter A., Leiter F., Zhou H., Henecker F., Meyer B.K., et al. Phys. Rev. Lett. 88:2002;045504/1-045504/4.
-
(2002)
Phys. Rev. Lett.
, vol.88
-
-
Hofmann, D.M.1
Hofstaetter, A.2
Leiter, F.3
Zhou, H.4
Henecker, F.5
Meyer, B.K.6
-
29
-
-
0035828802
-
-
Cox S.F.J., Davis E.A., King P.J.C., Gil J.M., Alberto H.V., Vilao R.C., et al. J. Phys.: Cond. Mater. 13:2001;9001.
-
(2001)
J. Phys.: Cond. Mater.
, vol.13
, pp. 9001
-
-
Cox, S.F.J.1
Davis, E.A.2
King, P.J.C.3
Gil, J.M.4
Alberto, H.V.5
Vilao, R.C.6
-
34
-
-
11544324480
-
-
Bagnall D.M., Chen Y.F., Shen M.Y., Zhu Z., Goto T., Yao T. J. Cryst. Growth. 184-185:1998;605.
-
(1998)
J. Cryst. Growth
, vol.184-185
, pp. 605
-
-
Bagnall, D.M.1
Chen, Y.F.2
Shen, M.Y.3
Zhu, Z.4
Goto, T.5
Yao, T.6
-
39
-
-
79958190246
-
-
Garces N.Y., Wang L., Bai L., Giles N.C., Halliburton L.E., Cantwell G. Appl. Phys. Lett. 81:2002;622.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 622
-
-
Garces, N.Y.1
Wang, L.2
Bai, L.3
Giles, N.C.4
Halliburton, L.E.5
Cantwell, G.6
-
43
-
-
6444221600
-
-
06
-
Palmer DW. Available from: http://www.semiconductors.co.uk, 2002.06.
-
(2002)
-
-
Palmer, D.W.1
-
44
-
-
0037080688
-
-
Florescu D., Mourok L.G., Pollack F.H., Look D.C., Cantwell G., Li X. J. Appl. Phys. 91:2002;890.
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 890
-
-
Florescu, D.1
Mourok, L.G.2
Pollack, F.H.3
Look, D.C.4
Cantwell, G.5
Li, X.6
-
53
-
-
0009916759
-
-
Wolk H., Deubler S., Forkel D., Foettinger H., Iwatschenko-Borho M., Meyer F., et al. Mater. Sci. Forum Part 3. 10-12:1986;863.
-
(1986)
Mater. Sci. Forum Part 3
, vol.10-12
, pp. 863
-
-
Wolk, H.1
Deubler, S.2
Forkel, D.3
Foettinger, H.4
Iwatschenko-Borho, M.5
Meyer, F.6
-
54
-
-
0035455497
-
-
Nagata T., Shimura T., Nakano Y., Ashida A., Fujimura N., Ito T. Jpn J. Appl. Phys. Part 1. 40:2001;5615.
-
(2001)
Jpn J. Appl. Phys. Part 1
, vol.40
, pp. 5615
-
-
Nagata, T.1
Shimura, T.2
Nakano, Y.3
Ashida, A.4
Fujimura, N.5
Ito, T.6
-
57
-
-
79956028331
-
-
Garces N.Y., Giles N.C., Halliburton L.E., Cantwell G., Eason D.B., Reynolds D.C., et al. Appl. Phys. Lett. 80:2002;1334.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 1334
-
-
Garces, N.Y.1
Giles, N.C.2
Halliburton, L.E.3
Cantwell, G.4
Eason, D.B.5
Reynolds, D.C.6
-
58
-
-
0031271578
-
-
Minegishi K., Koiwai Y., Kikuchi Y., Yano K., Kasuga M., Shimizu A. Jpn. J. Appl. Phys. 36:1997;L1453.
-
(1997)
Jpn. J. Appl. Phys.
, vol.36
-
-
Minegishi, K.1
Koiwai, Y.2
Kikuchi, Y.3
Yano, K.4
Kasuga, M.5
Shimizu, A.6
-
61
-
-
0034140970
-
-
Iwata K., Fons P., Yamada A., Matsubara K., Niki S. J. Cryst. Growth. 209:2000;526.
-
(2000)
J. Cryst. Growth
, vol.209
, pp. 526
-
-
Iwata, K.1
Fons, P.2
Yamada, A.3
Matsubara, K.4
Niki, S.5
-
63
-
-
79958230334
-
-
Look D.C., Reynolds D.C., Litton C.W., Jones R.L., Eason D.B., Cantwell G. Appl. Phys. Lett. 81:2002;1830.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 1830
-
-
Look, D.C.1
Reynolds, D.C.2
Litton, C.W.3
Jones, R.L.4
Eason, D.B.5
Cantwell, G.6
-
64
-
-
0042842376
-
-
Kim K.-K., Kim H.-S., Hwang D.-K., Lim J.-H., Park S.-J. Appl. Phys. Lett. 83:2003;63.
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 63
-
-
Kim, K.-K.1
Kim, H.-S.2
Hwang, D.-K.3
Lim, J.-H.4
Park, S.-J.5
-
65
-
-
0041823782
-
-
Heo Y.W., Park S.J., Ip K., Pearton S.J., Norton D.P. Appl. Phys. Lett. 83:2003;1128.
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 1128
-
-
Heo, Y.W.1
Park, S.J.2
Ip, K.3
Pearton, S.J.4
Norton, D.P.5
-
67
-
-
0033717519
-
-
Ryu Y.R., Zhu S., Look D.C., Wrobel J.M., Jeong H.M., White H.W. J. Cryst. Growth. 216:2000;330.
-
(2000)
J. Cryst. Growth
, vol.216
, pp. 330
-
-
Ryu, Y.R.1
Zhu, S.2
Look, D.C.3
Wrobel, J.M.4
Jeong, H.M.5
White, H.W.6
-
69
-
-
79956019567
-
-
Ohashi N., Ishigaki T., Okada N., Sekiguchi T., Sakaguchi I., Haneda H. Appl. Phys. Lett. 80:2002;2869.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 2869
-
-
Ohashi, N.1
Ishigaki, T.2
Okada, N.3
Sekiguchi, T.4
Sakaguchi, I.5
Haneda, H.6
-
70
-
-
0037087351
-
-
Theys B., Sallet V., Jomard F., Lusson A., Rommeluere J.-F., Teukam Z. J. Appl. Phys. 91:2002;3922.
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 3922
-
-
Theys, B.1
Sallet, V.2
Jomard, F.3
Lusson, A.4
Rommeluere, J.-F.5
Teukam, Z.6
-
73
-
-
2542473909
-
-
submitted for publication
-
Heo YW, Ip K, Park SJ, Pearton SJ, Norton DP. Appl Phys A, submitted for publication.
-
Appl Phys A
-
-
Heo, Y.W.1
Ip, K.2
Park, S.J.3
Pearton, S.J.4
Norton, D.P.5
-
74
-
-
0037352148
-
-
Kucheyev S.O., Jagadish C., Williams J.S., Deenapanray P.N.K., Yano M., Koike K., et al. J. Appl. Phys. 93:2003;2972.
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 2972
-
-
Kucheyev, S.O.1
Jagadish, C.2
Williams, J.S.3
Deenapanray, P.N.K.4
Yano, M.5
Koike, K.6
-
75
-
-
79956026568
-
-
Kucheyev S.O., Deenapanray P.N.L., Jagadish C., Williams J.S., Yano M., Kioke K., et al. Appl. Phys. Lett. 83:2002;3350.
-
(2002)
Appl. Phys. Lett.
, vol.83
, pp. 3350
-
-
Kucheyev, S.O.1
Deenapanray, P.N.L.2
Jagadish, C.3
Williams, J.S.4
Yano, M.5
Kioke, K.6
-
77
-
-
33748144907
-
-
in press
-
Maki H, Ikoma T, Sakaguchi I, Ohashi N, Haneda H, Tanaka J, et al. Thin Solid Films, in press.
-
Thin Solid Films
-
-
Maki, H.1
Ikoma, T.2
Sakaguchi, I.3
Ohashi, N.4
Haneda, H.5
Tanaka, J.6
-
81
-
-
0035125787
-
-
Lee J.-M., Chang K.-M., Kim K.-K., Choi W.-K., Park S.J. J. Electrochem. Soc. 148:2001;G1.
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. 1
-
-
Lee, J.-M.1
Chang, K.-M.2
Kim, K.-K.3
Choi, W.-K.4
Park, S.J.5
-
83
-
-
21844523605
-
-
Shul R.J., Lovejoy M.C., Baen A.G., Zolper J.C., Rieger D.J., Hafich M.J., et al. J. Vac. Sci. Technol. A. 13:1995;912.
-
(1995)
J. Vac. Sci. Technol. A
, vol.13
, pp. 912
-
-
Shul, R.J.1
Lovejoy, M.C.2
Baen, A.G.3
Zolper, J.C.4
Rieger, D.J.5
Hafich, M.J.6
-
85
-
-
0035392007
-
-
Pelhos K., Donnelly V.M., Komblit A., Green M.L., Van Dover R.B., Manchanda L., et al. J. Vac. Sci. Technol. A. 19:2001;1361.
-
(2001)
J. Vac. Sci. Technol. A
, vol.19
, pp. 1361
-
-
Pelhos, K.1
Donnelly, V.M.2
Komblit, A.3
Green, M.L.4
Van Dover, R.B.5
Manchanda, L.6
-
90
-
-
79956057219
-
-
Ip K., Baik K., Overberg M.E., Lambers E.S., Heo Y.W., Norton D.P., et al. Appl. Phys. Lett. 81:2002;3546.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 3546
-
-
Ip, K.1
Baik, K.2
Overberg, M.E.3
Lambers, E.S.4
Heo, Y.W.5
Norton, D.P.6
-
91
-
-
0141793154
-
-
Kim H.K., Bae J.W., Kim T.K., Kim K.K., Seong T.Y., Adesida I. J. Vac. Sci. Techol. B. 21:2003;1273.
-
(2003)
J. Vac. Sci. Techol. B
, vol.21
, pp. 1273
-
-
Kim, H.K.1
Bae, J.W.2
Kim, T.K.3
Kim, K.K.4
Seong, T.Y.5
Adesida, I.6
-
94
-
-
0036779176
-
-
Inumpudi A., Iliadis A.A., Krishnamoorthy S., Choopun S., Vispute R.D., Venkatesan T. Solid-State Electron. 46:2002;1665.
-
(2002)
Solid-state Electron.
, vol.46
, pp. 1665
-
-
Inumpudi, A.1
Iliadis, A.A.2
Krishnamoorthy, S.3
Choopun, S.4
Vispute, R.D.5
Venkatesan, T.6
-
98
-
-
0036638390
-
-
Sheng H., Emanetoglu N.W., Muthukumar S., Feng S., Lu Y. J. Electron. Mater. 31:2002;811.
-
(2002)
J. Electron. Mater.
, vol.31
, pp. 811
-
-
Sheng, H.1
Emanetoglu, N.W.2
Muthukumar, S.3
Feng, S.4
Lu, Y.5
-
99
-
-
0036686534
-
-
Kim S.Y., Jang H.W., Kim J.K., Jeon C.M., Park W.I., Yi G.C., et al. J. Electron. Mater. 31:2002;868.
-
(2002)
J. Electron. Mater.
, vol.31
, pp. 868
-
-
Kim, S.Y.1
Jang, H.W.2
Kim, J.K.3
Jeon, C.M.4
Park, W.I.5
Yi, G.C.6
-
104
-
-
0036600859
-
-
Ohashi N., Tanaka J., Ohgaki T., Haneda H., Ozawa M., Tsurumi T. J. Mater. Res. 17:2002;1529.
-
(2002)
J. Mater. Res.
, vol.17
, pp. 1529
-
-
Ohashi, N.1
Tanaka, J.2
Ohgaki, T.3
Haneda, H.4
Ozawa, M.5
Tsurumi, T.6
-
106
-
-
0000189926
-
-
Auret F.D., Goodman S.A., Hayes M., Legodi M.J., van Laarhoven H.A. Appl. Phys. Lett. 79:2001;3074 Auret FD. Private communication.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 3074
-
-
Auret, F.D.1
Goodman, S.A.2
Hayes, M.3
Legodi, M.J.4
Van Laarhoven, H.A.5
-
107
-
-
0000189926
-
-
Private communication
-
Auret F.D., Goodman S.A., Hayes M., Legodi M.J., van Laarhoven H.A. Appl. Phys. Lett. 79:2001;3074 Auret FD. Private communication.
-
-
-
Auret, F.D.1
-
111
-
-
0035911611
-
-
Cox S.J.F., Davis E.A., Cottrell S.P., King P.J.C., Lord J.S., Gil J.M., et al. Phys. Rev. Lett. 86:2001;2601.
-
(2001)
Phys. Rev. Lett.
, vol.86
, pp. 2601
-
-
Cox, S.J.F.1
Davis, E.A.2
Cottrell, S.P.3
King, P.J.C.4
Lord, J.S.5
Gil, J.M.6
-
112
-
-
0037185576
-
-
Hofmann D.M., Hofstaetter A., Leiter F., Zhou H., Henecker F., Meyer B.K., et al. Phys. Rev. Lett. 88:2002;045504.
-
(2002)
Phys. Rev. Lett.
, vol.88
, pp. 045504
-
-
Hofmann, D.M.1
Hofstaetter, A.2
Leiter, F.3
Zhou, H.4
Henecker, F.5
Meyer, B.K.6
-
113
-
-
0001174299
-
-
Baik S.J., Jang J.H., Lee C.H., Cho W.Y., Lim K.S. Appl. Phys. Lett. 70:1997;3516.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 3516
-
-
Baik, S.J.1
Jang, J.H.2
Lee, C.H.3
Cho, W.Y.4
Lim, K.S.5
-
121
-
-
0000189926
-
-
Auret F.D., Goodman S.A., Hayes M., Legodi M.J., Van Laarhoven H.A., Look D.C. Appl. Phys. Lett. 79:2001;3074.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 3074
-
-
Auret, F.D.1
Goodman, S.A.2
Hayes, M.3
Legodi, M.J.4
Van Laarhoven, H.A.5
Look, D.C.6
-
122
-
-
0035828725
-
-
Auret F.D., Goodman S.A., Hayes M., Legodi M.J., van Laarhoven H.A., Look D.C. J. Phys.: Condense Matter. 13:2001;8989.
-
(2001)
J. Phys.: Condense Matter
, vol.13
, pp. 8989
-
-
Auret, F.D.1
Goodman, S.A.2
Hayes, M.3
Legodi, M.J.4
Van Laarhoven, H.A.5
Look, D.C.6
-
123
-
-
0037455097
-
-
Ip K., Overberg M.E., Heo Y.W., Norton D.P., Pearton S.J., Stutz C.E., et al. Appl. Phys. Lett. 82:2003;385.
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 385
-
-
Ip, K.1
Overberg, M.E.2
Heo, Y.W.3
Norton, D.P.4
Pearton, S.J.5
Stutz, C.E.6
-
125
-
-
0011451973
-
-
Martin G.M., Mitonneau A., Pons D., Mircea A., Woodard D.W. J. Phys. C. 13:1980;3855.
-
(1980)
J. Phys. C
, vol.13
, pp. 3855
-
-
Martin, G.M.1
Mitonneau, A.2
Pons, D.3
Mircea, A.4
Woodard, D.W.5
-
127
-
-
33750419094
-
-
in press
-
Lavrov EV, Weber J, Borrnet F, Van de Walle CG, Helbig R. Phys Rev B, in press.
-
Phys Rev B
-
-
Lavrov, E.V.1
Weber, J.2
Borrnet, F.3
Van De Walle, C.G.4
Helbig, R.5
-
128
-
-
0001185215
-
-
Reynolds D.C., Look D.C., Jogai B., Litton C.W., Collins T.C., Harsch W., et al. Phys. Rev. B. 57:1998;12151.
-
(1998)
Phys. Rev. B
, vol.57
, pp. 12151
-
-
Reynolds, D.C.1
Look, D.C.2
Jogai, B.3
Litton, C.W.4
Collins, T.C.5
Harsch, W.6
-
129
-
-
0035672010
-
-
Thonke K., Gruber Th., Teofilov N., Schönfelder R., Waag A., Sauer R. Physica B. 308-310:2001;945.
-
(2001)
Physica B
, vol.308-310
, pp. 945
-
-
Thonke, K.1
Gruber, Th.2
Teofilov, N.3
Schönfelder, R.4
Waag, A.5
Sauer, R.6
-
136
-
-
0004924928
-
-
Haury A., Wasiela A., Arnoult A., Cibert J., Tatarenko S., Dietl T., et al. Phys. Rev. Lett. 79:1997;511 Kossacki P., Ferrand D., Arnoult A., Cibert J., Tatarenko S., Wasiela A., et al. Physica E. 6:2000;709.
-
(1997)
Phys. Rev. Lett.
, vol.79
, pp. 511
-
-
Haury, A.1
Wasiela, A.2
Arnoult, A.3
Cibert, J.4
Tatarenko, S.5
Dietl, T.6
-
137
-
-
0034138351
-
-
Haury A., Wasiela A., Arnoult A., Cibert J., Tatarenko S., Dietl T., et al. Phys. Rev. Lett. 79:1997;511 Kossacki P., Ferrand D., Arnoult A., Cibert J., Tatarenko S., Wasiela A., et al. Physica E. 6:2000;709.
-
(2000)
Physica E
, vol.6
, pp. 709
-
-
Kossacki, P.1
Ferrand, D.2
Arnoult, A.3
Cibert, J.4
Tatarenko, S.5
Wasiela, A.6
-
138
-
-
0032516694
-
-
Ohno H. Science. 281:1998;951.
-
(1998)
Science
, vol.281
, pp. 951
-
-
Ohno, H.1
-
139
-
-
0035356422
-
-
Sato K., Medvedkin G.A., Nishi T., Hasegawa Y., Misawa R., Hirose K., et al. J. Appl. Phys. 89:2001;7027.
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 7027
-
-
Sato, K.1
Medvedkin, G.A.2
Nishi, T.3
Hasegawa, Y.4
Misawa, R.5
Hirose, K.6
-
140
-
-
0035998590
-
-
Overberg M.E., Gila B.P., Thaler G.T., Abernathy C.R., Pearton S.J., Theodoropoulou N.A., et al. J. Vac. Sci. Technol. B. 20:2002;969.
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 969
-
-
Overberg, M.E.1
Gila, B.P.2
Thaler, G.T.3
Abernathy, C.R.4
Pearton, S.J.5
Theodoropoulou, N.A.6
-
141
-
-
0034635396
-
-
Dietl T., Ohno H., Matsukura F., Cubert J., Ferrand D. Science. 287:2000;1019.
-
(2000)
Science
, vol.287
, pp. 1019
-
-
Dietl, T.1
Ohno, H.2
Matsukura, F.3
Cubert, J.4
Ferrand, D.5
-
144
-
-
0037258011
-
-
Pearton S.J., Abernathy C.R., Overberg M.E., Thaler G.T., Norton D.P., Theodorpoulou N., et al. J. Appl. Phys. 93:2003;1.
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 1
-
-
Pearton, S.J.1
Abernathy, C.R.2
Overberg, M.E.3
Thaler, G.T.4
Norton, D.P.5
Theodorpoulou, N.6
-
145
-
-
0037470283
-
-
Pearton S.J., Abernathy C.R., Norton D.P., Hebard A.F., Park Y.D., Boatner L.A., et al. Mater. Sci. Eng. R. 40:2003;137.
-
(2003)
Mater. Sci. Eng. R.
, vol.40
, pp. 137
-
-
Pearton, S.J.1
Abernathy, C.R.2
Norton, D.P.3
Hebard, A.F.4
Park, Y.D.5
Boatner, L.A.6
-
147
-
-
0035339439
-
-
Wakano T., Fujimura N., Morinaga Y., Abe N., Ashida A., Ito T. Physica C. 10:2001;260.
-
(2001)
Physica C
, vol.10
, pp. 260
-
-
Wakano, T.1
Fujimura, N.2
Morinaga, Y.3
Abe, N.4
Ashida, A.5
Ito, T.6
-
148
-
-
0000128434
-
-
Fukumura T., Jin Z., Ohtomo A., Koinuma H., Kawasaki M. Appl. Phys. Lett. 75:1999;3366.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 3366
-
-
Fukumura, T.1
Jin, Z.2
Ohtomo, A.3
Koinuma, H.4
Kawasaki, M.5
-
149
-
-
79956009402
-
-
Jung S.W., An S.-J., Yi G.-C., Jung C.U., Lee S.-I., Cho S. Appl. Phys. Lett. 80:2002;4561.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 4561
-
-
Jung, S.W.1
An, S.-J.2
Yi, G.-C.3
Jung, C.U.4
Lee, S.-I.5
Cho, S.6
-
152
-
-
0038780599
-
-
Norton DP, Pearton SJ, Hebard AF, Theodoropoulou N, Boatner LA, Wilson RG. Appl Phys Lett.
-
Appl Phys Lett
-
-
Norton, D.P.1
Pearton, S.J.2
Hebard, A.F.3
Theodoropoulou, N.4
Boatner, L.A.5
Wilson, R.G.6
-
155
-
-
0034188499
-
-
Guo L.W., Peng D.L., Makino H., Inaba K., Ko H.J., Sumiyama K., et al. J. Magn. Magn. Mater. 213:2000;321.
-
(2000)
J. Magn. Magn. Mater.
, vol.213
, pp. 321
-
-
Guo, L.W.1
Peng, D.L.2
Makino, H.3
Inaba, K.4
Ko, H.J.5
Sumiyama, K.6
-
156
-
-
0009916759
-
-
Wolf H., Deubler S., Forkel D., Foettinger H., Iwatschenko-Borho M., Meyer F., et al. Mater. Sci. Forum, Part 3. 10-12:1986;863.
-
(1986)
Mater. Sci. Forum, Part 3
, vol.10-12
, pp. 863
-
-
Wolf, H.1
Deubler, S.2
Forkel, D.3
Foettinger, H.4
Iwatschenko-Borho, M.5
Meyer, F.6
-
157
-
-
0000700044
-
-
Teng C.W., Muth J.F., Özgür Ü., Bergmann M.J., Everitt H.O., Sharma A.K., et al. Appl. Phys. Lett. 76:2000;979.
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 979
-
-
Teng, C.W.1
Muth, J.F.2
Özgür, Ü.3
Bergmann, M.J.4
Everitt, H.O.5
Sharma, A.K.6
-
159
-
-
0035793357
-
-
Matsumoto Y., Murakami M., Shono T., Hasegawa T., Fukumura T., Kawasaki M., et al. Science. 291:2001;854.
-
(2001)
Science
, vol.291
, pp. 854
-
-
Matsumoto, Y.1
Murakami, M.2
Shono, T.3
Hasegawa, T.4
Fukumura, T.5
Kawasaki, M.6
-
160
-
-
0035914869
-
-
Chambers S.A., Thevuthasan S., Farrow R.F.C., Marks R.F., Thiele U.U., Folks L., et al. Appl. Phys. Lett. 79:2001;3467.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 3467
-
-
Chambers, S.A.1
Thevuthasan, S.2
Farrow, R.F.C.3
Marks, R.F.4
Thiele, U.U.5
Folks, L.6
-
165
-
-
0035827304
-
-
Huang M.H., Mao S., Feick H., Yan H., Wu Y., Kind H., et al. Science. 292:2001;1897.
-
(2001)
Science
, vol.292
, pp. 1897
-
-
Huang, M.H.1
Mao, S.2
Feick, H.3
Yan, H.4
Wu, Y.5
Kind, H.6
-
166
-
-
79956032197
-
-
Heo Y.W., Varadarjan V., Kaufman M., Kim K., Norton D.P., Ren F., et al. Appl. Phys. Lett. 81:2002;3046.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 3046
-
-
Heo, Y.W.1
Varadarjan, V.2
Kaufman, M.3
Kim, K.4
Norton, D.P.5
Ren, F.6
-
167
-
-
0037175831
-
-
Han S.-J., Song J.W., Yang C.-H., Park S.H., Park J.-H., Jeong J.H., et al. Appl. Phys. Lett. 81:2002;4212.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 4212
-
-
Han, S.-J.1
Song, J.W.2
Yang, C.-H.3
Park, S.H.4
Park, J.-H.5
Jeong, J.H.6
-
171
-
-
0038110864
-
-
Wollenstein J., Plaza J.A., Cane C., Min Y., Botttner H., Tuller H.L. Sensors Actuat. B. 93:2003;350.
-
(2003)
Sensors Actuat. B
, vol.93
, pp. 350
-
-
Wollenstein, J.1
Plaza, J.A.2
Cane, C.3
Min, Y.4
Botttner, H.5
Tuller, H.L.6
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