메뉴 건너뛰기




Volumn 68, Issue 25, 1996, Pages 3650-3652

A ferroelectric transparent thin-film transistor

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; FERROELECTRIC MATERIALS; HYSTERESIS; POLARIZATION; PULSED LASER APPLICATIONS; RELAXATION PROCESSES; SEMICONDUCTING LEAD COMPOUNDS; STRONTIUM COMPOUNDS; SWITCHING; TIN COMPOUNDS;

EID: 0030168131     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115759     Document Type: Article
Times cited : (191)

References (20)
  • 1
    • 0009188101 scopus 로고    scopus 로고
    • J.C. Crawford and F.L. English, IEEE Trans. Electron Devices ED-16, 525 (1969), and references therein.
    • J.C. Crawford and F.L. English, IEEE Trans. Electron Devices ED-16, 525 (1969), and references therein.
  • 2
    • 0016091777 scopus 로고    scopus 로고
    • S.-Y. Wu, IEEE Trans. Electron Devices 21, 499 (1974); Ferroelectrics 11, 379 (1976); K. Sugibuchi, Y. Kurogi, and N. Endo, J. Appl. Phys. 46, 2877 (1975).
    • S.-Y. Wu, IEEE Trans. Electron Devices 21, 499 (1974); Ferroelectrics 11, 379 (1976); K. Sugibuchi, Y. Kurogi, and N. Endo, J. Appl. Phys. 46, 2877 (1975).
  • 3
    • 33751274718 scopus 로고    scopus 로고
    • Y. Higuma, Y. Matsui, M. Okuyama, T. Nakagawa, and Y. Hamakawa, Jpn. J. Appl. Phys. 17 Suppl. 17-1, 209 (1977); T.A. Rost, H. Lin, and T.A. Rabson, Appl. Phys. Lett. 59, 3654 (1991); D.R. Lampe, D.A. Adams, M. Austin, M. Polinsky, J. Dzimianski, S. Sinharoy, H. Buhay, P. Brabant, and Y.M. Liu, Ferroelectrics 133, 61 (1992); S. Sinharoy, H. Buhay, M.H. Francombe, and D.R. Lampe, Integrated Ferroelectrics 3, 217 (1993); T.S. Kalkur, ibid. 4, 357 (1994); T.A. Rabson, T.A. Rost, and H. Lin, ibid. 6, 15 (1995); Y. Nakao, T. Nakamura, A. Kamisawa, and H. Takasu, ibid. 6, 23 (1995); T. Nakamura, Y. Nakao, A. Kamisawa, and H. Takasu, ibid. 9, 179 (1995).
    • Y. Higuma, Y. Matsui, M. Okuyama, T. Nakagawa, and Y. Hamakawa, Jpn. J. Appl. Phys. 17 Suppl. 17-1, 209 (1977); T.A. Rost, H. Lin, and T.A. Rabson, Appl. Phys. Lett. 59, 3654 (1991); D.R. Lampe, D.A. Adams, M. Austin, M. Polinsky, J. Dzimianski, S. Sinharoy, H. Buhay, P. Brabant, and Y.M. Liu, Ferroelectrics 133, 61 (1992); S. Sinharoy, H. Buhay, M.H. Francombe, and D.R. Lampe, Integrated Ferroelectrics 3, 217 (1993); T.S. Kalkur, ibid. 4, 357 (1994); T.A. Rabson, T.A. Rost, and H. Lin, ibid. 6, 15 (1995); Y. Nakao, T. Nakamura, A. Kamisawa, and H. Takasu, ibid. 6, 23 (1995); T. Nakamura, Y. Nakao, A. Kamisawa, and H. Takasu, ibid. 9, 179 (1995).
  • 4
    • 0005021690 scopus 로고    scopus 로고
    • C.H. Seager, D. McIntyre, B.A. Tuttle, and J. Evans, Integrated Ferroelectrics 6, 47 (1995).
    • C.H. Seager, D. McIntyre, B.A. Tuttle, and J. Evans, Integrated Ferroelectrics 6, 47 (1995).
  • 6
    • 21544434762 scopus 로고    scopus 로고
    • J.F.M. Cillessen, R.M. Wolf, J.B. Giesbers, P.W.M. Blom, K.-O. Grosse-Holz, and E. Pastoor, Appl. Surf. Sci. (to be published).
    • J.F.M. Cillessen, R.M. Wolf, J.B. Giesbers, P.W.M. Blom, K.-O. Grosse-Holz, and E. Pastoor, Appl. Surf. Sci. (to be published).
  • 7
    • 0029776311 scopus 로고    scopus 로고
    • R.M. Wolf, J.F.M. Cillessen, J.B. Giesbers, E. Pastoor, G. Müller, K.-O, Grosse-Holz, and P.W.M. Blom, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 163 (1996).
    • R.M. Wolf, J.F.M. Cillessen, J.B. Giesbers, E. Pastoor, G. Müller, K.-O, Grosse-Holz, and P.W.M. Blom, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 163 (1996).
  • 9
    • 21544460018 scopus 로고    scopus 로고
    • Ferroelectric Thin Films III, Mater. Res. Symp. Proc. 310, edited by E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (MRS, Pittsburgh, 1993).
    • Ferroelectric Thin Films III, Mater. Res. Symp. Proc. 310, edited by E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (MRS, Pittsburgh, 1993).
  • 12
    • 21544475112 scopus 로고    scopus 로고
    • N. Tsuda, K. Nasu, A. Yanase, and K. Siratori, Electronic Conduction in Oxides, Springer Series in Solid State Sci. Vol. 94 (Springer, Berlin, 1991).
    • N. Tsuda, K. Nasu, A. Yanase, and K. Siratori, Electronic Conduction in Oxides, Springer Series in Solid State Sci. Vol. 94 (Springer, Berlin, 1991).
  • 14
    • 0029734772 scopus 로고    scopus 로고
    • K.-O. Grosse-Holz, J.F.M. Cillessen, M.W. J. Prins, P.W.M. Blom, R.M. Wolf,. L.F. Feiner, and R. Waser, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 67 (1996).
    • K.-O. Grosse-Holz, J.F.M. Cillessen, M.W. J. Prins, P.W.M. Blom, R.M. Wolf,. L.F. Feiner, and R. Waser, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 67 (1996).
  • 15
    • 21544476581 scopus 로고    scopus 로고
    • S.M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
    • S.M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
  • 16
    • 21544449574 scopus 로고    scopus 로고
    • Also the gate current exhibits hysteresis, due to the ferroelectric polarization and charging effects; for a discussion on polarization-dependent conduction through a ferroelectric system, see for example P.W.M. Blom, R.M. Wolf, J.F.M. Cillessen, and M.P.C.M. Krijn, Phys. Rev. Lett. 73, 2107 (1994); Y. Watanabe, Appl. Phys. Lett. 66, 28 (1995).
    • Also the gate current exhibits hysteresis, due to the ferroelectric polarization and charging effects; for a discussion on polarization-dependent conduction through a ferroelectric system, see for example P.W.M. Blom, R.M. Wolf, J.F.M. Cillessen, and M.P.C.M. Krijn, Phys. Rev. Lett. 73, 2107 (1994); Y. Watanabe, Appl. Phys. Lett. 66, 28 (1995).
  • 17
    • 34547564663 scopus 로고    scopus 로고
    • C.B. Sawyer and C.H. Tower, Phys. Rev. 35, 269 (1930).
    • C.B. Sawyer and C.H. Tower, Phys. Rev. 35, 269 (1930).
  • 18
    • 21544469834 scopus 로고    scopus 로고
    • Due to the time-dependence of the on- and the off-state (i.e. the relaxation effects due to charge trapping; see the following paragraph), the on/off ratio is smaller in Fig. 3 (time scale of minutes) than in Fig. 2 (taken on a time scale of seconds).
    • Due to the time-dependence of the on- and the off-state (i.e. the relaxation effects due to charge trapping; see the following paragraph), the on/off ratio is smaller in Fig. 3 (time scale of minutes) than in Fig. 2 (taken on a time scale of seconds).
  • 20
    • 0029336309 scopus 로고    scopus 로고
    • 3 or ZnO) is for example discussed in Ref. 4 and: V. Srikant, V. Sergo, and D.R. Clarke, J. Am. Ceram. Soc. 78, 1931 (1995); 78, 1935 (1995).
    • 3 or ZnO) is for example discussed in Ref. 4 and: V. Srikant, V. Sergo, and D.R. Clarke, J. Am. Ceram. Soc. 78, 1931 (1995); 78, 1935 (1995).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.