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1
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0009188101
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J.C. Crawford and F.L. English, IEEE Trans. Electron Devices ED-16, 525 (1969), and references therein.
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J.C. Crawford and F.L. English, IEEE Trans. Electron Devices ED-16, 525 (1969), and references therein.
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2
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0016091777
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S.-Y. Wu, IEEE Trans. Electron Devices 21, 499 (1974); Ferroelectrics 11, 379 (1976); K. Sugibuchi, Y. Kurogi, and N. Endo, J. Appl. Phys. 46, 2877 (1975).
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S.-Y. Wu, IEEE Trans. Electron Devices 21, 499 (1974); Ferroelectrics 11, 379 (1976); K. Sugibuchi, Y. Kurogi, and N. Endo, J. Appl. Phys. 46, 2877 (1975).
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3
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33751274718
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Y. Higuma, Y. Matsui, M. Okuyama, T. Nakagawa, and Y. Hamakawa, Jpn. J. Appl. Phys. 17 Suppl. 17-1, 209 (1977); T.A. Rost, H. Lin, and T.A. Rabson, Appl. Phys. Lett. 59, 3654 (1991); D.R. Lampe, D.A. Adams, M. Austin, M. Polinsky, J. Dzimianski, S. Sinharoy, H. Buhay, P. Brabant, and Y.M. Liu, Ferroelectrics 133, 61 (1992); S. Sinharoy, H. Buhay, M.H. Francombe, and D.R. Lampe, Integrated Ferroelectrics 3, 217 (1993); T.S. Kalkur, ibid. 4, 357 (1994); T.A. Rabson, T.A. Rost, and H. Lin, ibid. 6, 15 (1995); Y. Nakao, T. Nakamura, A. Kamisawa, and H. Takasu, ibid. 6, 23 (1995); T. Nakamura, Y. Nakao, A. Kamisawa, and H. Takasu, ibid. 9, 179 (1995).
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4
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0005021690
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C.H. Seager, D. McIntyre, B.A. Tuttle, and J. Evans, Integrated Ferroelectrics 6, 47 (1995).
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6
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J.F.M. Cillessen, R.M. Wolf, J.B. Giesbers, P.W.M. Blom, K.-O. Grosse-Holz, and E. Pastoor, Appl. Surf. Sci. (to be published).
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J.F.M. Cillessen, R.M. Wolf, J.B. Giesbers, P.W.M. Blom, K.-O. Grosse-Holz, and E. Pastoor, Appl. Surf. Sci. (to be published).
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7
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0029776311
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R.M. Wolf, J.F.M. Cillessen, J.B. Giesbers, E. Pastoor, G. Müller, K.-O, Grosse-Holz, and P.W.M. Blom, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 163 (1996).
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R.M. Wolf, J.F.M. Cillessen, J.B. Giesbers, E. Pastoor, G. Müller, K.-O, Grosse-Holz, and P.W.M. Blom, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 163 (1996).
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9
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21544460018
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Ferroelectric Thin Films III, Mater. Res. Symp. Proc. 310, edited by E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (MRS, Pittsburgh, 1993).
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Ferroelectric Thin Films III, Mater. Res. Symp. Proc. 310, edited by E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (MRS, Pittsburgh, 1993).
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N. Tsuda, K. Nasu, A. Yanase, and K. Siratori, Electronic Conduction in Oxides, Springer Series in Solid State Sci. Vol. 94 (Springer, Berlin, 1991).
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N. Tsuda, K. Nasu, A. Yanase, and K. Siratori, Electronic Conduction in Oxides, Springer Series in Solid State Sci. Vol. 94 (Springer, Berlin, 1991).
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14
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K.-O. Grosse-Holz, J.F.M. Cillessen, M.W. J. Prins, P.W.M. Blom, R.M. Wolf,. L.F. Feiner, and R. Waser, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 67 (1996).
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K.-O. Grosse-Holz, J.F.M. Cillessen, M.W. J. Prins, P.W.M. Blom, R.M. Wolf,. L.F. Feiner, and R. Waser, in Epitaxial Oxide Thin Films II, Mater. Soc. Symp. Proc. 401, 67 (1996).
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S.M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
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S.M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
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16
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21544449574
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Also the gate current exhibits hysteresis, due to the ferroelectric polarization and charging effects; for a discussion on polarization-dependent conduction through a ferroelectric system, see for example P.W.M. Blom, R.M. Wolf, J.F.M. Cillessen, and M.P.C.M. Krijn, Phys. Rev. Lett. 73, 2107 (1994); Y. Watanabe, Appl. Phys. Lett. 66, 28 (1995).
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Also the gate current exhibits hysteresis, due to the ferroelectric polarization and charging effects; for a discussion on polarization-dependent conduction through a ferroelectric system, see for example P.W.M. Blom, R.M. Wolf, J.F.M. Cillessen, and M.P.C.M. Krijn, Phys. Rev. Lett. 73, 2107 (1994); Y. Watanabe, Appl. Phys. Lett. 66, 28 (1995).
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17
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C.B. Sawyer and C.H. Tower, Phys. Rev. 35, 269 (1930).
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C.B. Sawyer and C.H. Tower, Phys. Rev. 35, 269 (1930).
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18
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21544469834
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Due to the time-dependence of the on- and the off-state (i.e. the relaxation effects due to charge trapping; see the following paragraph), the on/off ratio is smaller in Fig. 3 (time scale of minutes) than in Fig. 2 (taken on a time scale of seconds).
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Due to the time-dependence of the on- and the off-state (i.e. the relaxation effects due to charge trapping; see the following paragraph), the on/off ratio is smaller in Fig. 3 (time scale of minutes) than in Fig. 2 (taken on a time scale of seconds).
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19
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36449008557
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P.K. Larsen, G.L.M. Kampschöer, M.J.E. Ulenaers, G.A.C.M. Spierings, and R. Cuppens, Appl. Phys. Lett. 59, 611 (1991).
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(1991)
Appl. Phys. Lett.
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Larsen, P.K.1
Kampschöer, G.L.M.2
Ulenaers, M.J.E.3
Spierings, G.A.C.M.4
Cuppens, R.5
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20
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0029336309
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3 or ZnO) is for example discussed in Ref. 4 and: V. Srikant, V. Sergo, and D.R. Clarke, J. Am. Ceram. Soc. 78, 1931 (1995); 78, 1935 (1995).
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3 or ZnO) is for example discussed in Ref. 4 and: V. Srikant, V. Sergo, and D.R. Clarke, J. Am. Ceram. Soc. 78, 1931 (1995); 78, 1935 (1995).
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