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Volumn 76, Issue 12, 2004, Pages 3445-3470

X-ray spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROPHOTOMETRY; CALCULATION; CALIBRATION; COMPTON EFFECT; ELECTRON PROBE MICROANALYSIS; EMISSION TOMOGRAPHY; ENERGY DISPERSIVE X RAY FLUORESCENCE ANALYSIS; HOLOGRAPHY; IMAGE ANALYSIS; INSTRUMENTATION; MEASUREMENT; OPTICAL ROTATION; PARTICLE INDUCED X RAY EMISSION; QUANTITATIVE ANALYSIS; REVIEW; SAMPLE; SENSITIVITY AND SPECIFICITY; STANDARD; STRUCTURE ANALYSIS; TECHNIQUE; TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS; X RAY ABSORPTION SPECTROMETRY; X RAY ANALYSIS; X RAY FLUORESCENCE; X RAY SPECTROMETRY;

EID: 2942567611     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0400820     Document Type: Review
Times cited : (11)

References (223)
  • 53
    • 0037112046 scopus 로고    scopus 로고
    • Service, R. F. Science 2002, 298, 1356-1358.
    • (2002) Science , vol.298 , pp. 1356-1358
    • Service, R.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.