Specific effects and deconvolution in submicrometre EPMA: Application to binary diffusion

X-Ray Spectrometry

Volumn 32, Issue 5, 2003, Pages 345-362

  Arnould, Olivier ^a,b   Hild, François ^a  

^a CNRS   (France)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTROMAGNETIC WAVE EMISSION; GEOMETRY; X RAY SCATTERING;

BINARY DIFFUSION; CONCENTRATION PROFILES; DECONVOLUTIONS; ELECTRON PROBE X RAY MICROANALYSIS; ELEMENTAL COMPOSITIONS; NEAR SURFACES; SEMI-QUANTITATIVE EVALUATIONS; SPECIFIC EFFECTS; SUBMICROMETERS; X-RAY EMISSION;

DECONVOLUTION;

EID: 0041927672     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.651     Document Type: Article

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