Algorithm of fundamental parameters for the SEICXRF method

X-Ray Spectrometry

Volumn 32, Issue 4, 2003, Pages 312-316

  Garcia M ^a   Figueroa, R ^a   Rivera, R ^a  

^a UNIVERSIDAD DE LA FRONTERA   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETER ESTIMATION;

ABSORPTION EDGE ENERGIES; ABSORPTION EDGES; ANALYTES; ENERGY; FLUORESCENCE ENERGY; FLUORESCENCE YIELD; FLUORESCENT EMISSION; FUNDAMENTAL PARAMETER METHOD; NEW EXPERIMENTAL METHOD; SECONDARY FLUORESCENCE;

FLUORESCENCE;

EID: 0041309844     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.642     Document Type: Article

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