Construction of a focusing high-resolution crystal analyser for x-rays

X-Ray Spectrometry

Volumn 31, Issue 2, 2002, Pages 158-161

  Tirao, G ^a   Cusatis, C ^b   Stutz, G ^a  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

SUBSTRATES;

ANGULAR DIVERGENCE; BACK DIFFRACTION; BEAM-LINES; CRYSTAL SURFACES; ENERGY RESOLUTIONS; GLASS SUBSTRATES; HIGH RESOLUTION; SI CRYSTALS; SPHERICAL CRYSTAL; XRD;

FOCUSING;

EID: 0036109393     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.542     Document Type: Article

References (22)

1. James RW. The Optical Principles of the Diffraction of X-Rays. G. Bell: London, 1967.
2. Giles C, Cusatis C. Appl. Phys. Lett. 1991; 59: 641; Cusatis C, Udron D, Mazzaro I, Giles C, Tolentino H. Acta Crystallogr., sect. A 1996; 52: 621.
3. Giles C, Cusatis C. Appl. Phys. Lett. 1991; 59: 641; Cusatis C, Udron D, Mazzaro I, Giles C, Tolentino H. Acta Crystallogr., sect. A 1996; 52: 621.
4. Stojanoff V, Hämäläinen K, Siddons DP, Hastings JB, Berman LE, Cramer S, Smith G. Rev. Sci. Instrum. 1992; 63: 1125.
5. Schülke W, Nagasawa H. Nucl. Instrum. Methods 1984; 222: 203;
6. Berthold A, Mourikis S, Schmitz JR, Schülke W, Schulte-Schrepping H. Nucl. Instrum. Methods A 1992; 317: 373;
7. Kao C-C, Hamalainen K, Krisch M, Siddons DP, Oversluizen T, Hastings JB. Rev. Sci. Instrum. 1995; 66: 1699.
8. Burkel E, Dorner B, Illini Th, Peisl J. J. Appl. Crystallogr. 1991; 24: 1042;
9. Masciovecchio C, Bergmann U, Krisch M, Ruocco G, Sette F, Verbeni R. Nucl. Instrum. Methods B 1996; 111: 181;
10. Schwoerer-Böhning M, Macrander AT, Abbamonte PM. Rev. Sci. Instrum. 1998; 69: 3109.
11. Cusatis C, Kobayashi Franco M, Kakuno E, Giles C, Morelhão S, Mello V, Mazzaro I. J. Synchrotron Radiat. 1998; 5: 491.
12. Helsen JE, Kuczumow A. In Handbook of X-Ray Spectrometry, Van Grieken R, Markowicz A (eds). Marcel Dekker: New York, 1993; 75-149.
13. Schülke W. In Handbook on Synchrotron Radiation, Brown G, Moncton DE (eds). North-Holland: Amsterdam, 1991; 565-637.
14. Nagasawa H, Mourikis S, Schülke W. J. Phys. Soc. Jpn. 1989; 58: 710.
15. Tirao G, Cusatis C, Stutz G. LNLS Activity Rep. 2000; 99: 3, sect. 7 Tirao G, Cusatis C, Stutz G. LNLS Activity Rep. 2001; in press.
16. Tirao G, Cusatis C, Stutz G. LNLS Activity Rep. 2000; 99: 3, sect. 7 Tirao G, Cusatis C, Stutz G. LNLS Activity Rep. 2001; in press.
17. Taniguchi K. Bull. Chem. Soc. Jpn. 1984; 57: 915; Urch DS. J. Phys. C: Solid State Phys. 1970; 3: 1275.
18. Taniguchi K. Bull. Chem. Soc. Jpn. 1984; 57: 915; Urch DS. J. Phys. C: Solid State Phys. 1970; 3: 1275.
19. Konishi T, Kawai J, Fujiwara M, Kurisaki T, Wakita H, Gohshi Y. X-Ray Spectrom. 1999; 28: 470.
20. Mukoyama T, Taniguchi K, Adachi H. X-Ray Spectrom. 2000; 29: 426.
21. Küchler D, Lehnert U, Zschornack G. X-Ray Spectrom. 1998; 27: 177.
22. Hamalainen K, Siddons DP, Hastings JB, Berman LE. Phys. Rev. Lett. 1991; 67: 8850.