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Volumn 80, Issue 20, 2002, Pages 3709-3711

Phosphorus-doped silicon nanowires studied by near edge x-ray absorption fine structure spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDINGS; CRYSTALLINE SILICONS; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; PHOSPHORUS-DOPED; SILICON NANOWIRES; SILICON OXIDE LAYERS; SILICON WIRES; TOTAL ELECTRON YIELD; X RAY FLUORESCENCE;

EID: 79955985112     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1478796     Document Type: Article
Times cited : (39)

References (28)
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    • D. A. Muller, Nature (London) 399, 758 (1999). nat NATUAS 0028-0836
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    • M. Schulz, Nature (London) 399, 729 (1999). nat NATUAS 0028-0836
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    • D. H. Cobden, Nature (London) 409, 32 (2001). nat NATUAS 0028-0836
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.