The differential PIXE set-up at the Van de Graaff laboratory in Florence

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 56-61

  Fedi, M E ^a   Chiari, M ^a   Giuntini, L ^a   Lucarelli, F ^a   Mando P A ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

Depth profile; Different energies; External beam; Paint layers; PIXE

Indexed keywords

ENERGY DISSIPATION; PARTICLE ACCELERATORS; PROTONS; X RAY SPECTROSCOPY;

PARTICLE INDUCED X-RAY EMISSION (PIXE);

HIGH ENERGY PHYSICS;

EID: 0036534892     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00994-6     Document Type: Article

References (11)