Enhancement of TXRF intensity by using a reflector

X-Ray Spectrometry

Volumn 31, Issue 5, 2002, Pages 358-362

  Tsuji, Kouichi ^a   Wagatsuma, Kazuaki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD DEPOSITS;

KΑ; MULTI-REFLECTION EFFECTS; SIMPLE++; THIN LAYERS; X RAY INTENSITY; X-RAY BACKGROUND;

REFLECTION;

EID: 0036391818     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.583     Document Type: Article

References (10)

1. Klockenkamper R. Total-Reflection X-Ray Fluorescence Analysis. John Wiley & Sons: New York, 1997.
2. Yoneda Y, Horiuchi T. Rev. Sci. Instrum. 1971; 42: 1069.
3. Janssens K, Adams F, Rindby A (eds). Micro X-Ray Fluorescence Analysis. John Wiley & Sons: New York, 2000.
4. Sanchez HJ, Perez CA. J. Trace Microprobe Tech. 1998; 16: 501.
5. Cheburkin AK, Shotyk W. X-Ray Spectrom. 1996; 25: 175.
6. Wobrauschek P, Kregsamer P, Ladisich W, Rieder R, Streli C. Spectrochim. Acta, Part B 1993; 48: 143.
7. Egorov VK, Zuev AP, Kondratiev OS, Egorov EV. In Abstracts Book of the 8th TXRF 2000 Conference (Vienna, Austria). 2000; 47.
8. Sanchez HJ, et al. In Abstracts Book of 7th SARX 2000 conference (Sao Pedro, Brazil). 2000; 115.
9. Tsuji K. In Abstracts Book of ICAS2001 Conference (Tokyo, Japan). 2001; 284.
10. Tsuji K, Wagatsuma K, Hirokawa K, Yamada T, Utaka T. Spectrochim. Acta, Part B 1997; 52: 841.