SCOPUS 정보 검색 플랫폼

Journal of Analytical Atomic Spectrometry

Volumn 18, Issue 10, 2003, Pages 1297-1316

Atomic spectrometry update. X-ray fluorescence spectrometry

(7) Potts, Philip J a Ellis, Andrew T b Kregsamer, Peter c Marshall, John d Streli, Christina c West, Margaret e Wobrauschek, Peter c

a OPEN UNIVERSITY (United Kingdom)

b OXFORD INSTRUMENTS PLASMA TECHNOLOGY (United Kingdom)

c TU WIEN (Austria)

d GLASGOW CALEDONIAN UNIVERSITY (United Kingdom)

e West X ray Solutions Ltd (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; PRINCIPAL COMPONENT ANALYSIS; RADIATION DETECTORS; SPECTROMETRY; SPECTRUM ANALYSIS;

X-RAY FLUORESCENCE;

X RAY OPTICS;

EID: 0242303669 PISSN: 02679477 EISSN: None Source Type: Journal
DOI: 10.1039/b309420k Document Type: Review

Times cited : (19)

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