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Volumn 138-139, Issue 138/3-4,139/1-4, 2002, Pages 115-124
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EPMA present and future
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Author keywords
Expert systems; Standardless analysis; Surfaces and coatings; X ray detectors; X ray spectrometers
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Indexed keywords
ACCURACY;
COMPUTER PROGRAM;
CONFERENCE PAPER;
DISPERSION;
ELECTRON PROBE MICROANALYSIS;
ENERGY;
OPTICS;
PARTICLE SIZE;
QUANTITATIVE ANALYSIS;
SPECTRAL SENSITIVITY;
X RAY SPECTROMETRY;
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EID: 0036314402
PISSN: 00263672
EISSN: None
Source Type: Journal
DOI: 10.1007/s006040200018 Document Type: Conference Paper |
Times cited : (4)
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References (46)
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