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Volumn 138-139, Issue 138/3-4,139/1-4, 2002, Pages 115-124

EPMA present and future

Author keywords

Expert systems; Standardless analysis; Surfaces and coatings; X ray detectors; X ray spectrometers

Indexed keywords

ACCURACY; COMPUTER PROGRAM; CONFERENCE PAPER; DISPERSION; ELECTRON PROBE MICROANALYSIS; ENERGY; OPTICS; PARTICLE SIZE; QUANTITATIVE ANALYSIS; SPECTRAL SENSITIVITY; X RAY SPECTROMETRY;

EID: 0036314402     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040200018     Document Type: Conference Paper
Times cited : (4)

References (46)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.