M spectra of elements 39 ≤ Z ≤ 56 measured with an ultra-thin window Si(Li) detector

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 195-200

  Wendt, Michael ^a  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

Energy dispersive spectrometry; M lines; Ultra thin window detectors; X ray spectra

Indexed keywords

EID: 0344388676     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200061     Document Type: Article

References (8)

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