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Volumn 31, Issue 3, 2002, Pages 209-218

Accuracy of the fundamental parameter method for x-ray fluorescence analysis of rocks

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONS; FLUORESCENCE; RADIATION EFFECTS; ROCKS; UNCERTAINTY ANALYSIS;

EID: 0036272115     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.528     Document Type: Article
Times cited : (28)

References (33)
  • 16
    • 0042718231 scopus 로고
    • MBXCOR a new package for the automatic CAMEBAX microprobe
    • Henoc J, Tong M. MBXCOR a new package for the automatic CAMEBAX microprobe. Cameca News, 1980.
    • (1980) Cameca News
    • Henoc, J.1    Tong, M.2
  • 33
    • 85153552000 scopus 로고    scopus 로고
    • Patent Russian Federation No. 2098791, 1995
    • Borkhodoev VYa. Patent Russian Federation No. 2098791, 1995.
    • Borkhodoev, V.Ya.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.