Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials

Analytical Chemistry

Volumn 75, Issue 15, 2003, Pages 3831-3836

  Awane, Tohru ^a   Kimura, Takashi ^a   Nishida, Kenji ^a   Ishikawa, Nobuhiro ^a   Tanuma, Shigeo ^a   Nakamura, Morihiko ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS (EPMA);

ELECTRONS; ETCHING; INCLUSIONS; STAINLESS STEEL; THIN FILMS; X RAYS;

MICROANALYSIS;

METAL; STAINLESS STEEL; ZINC OXIDE;

ANALYTIC METHOD; ARTICLE; FILM; GRAZING EXIT ELECTRON PROBE MICROANALYSIS; MICROANALYSIS; QUANTITATIVE ANALYSIS; X RAY;

EID: 0042563181     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac020740l     Document Type: Article

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