Particle analysis by SEM/EDXS and specimen damage

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 171-177

  Schmied, Mario ^a   Poelt, Peter ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

EDXS; Particle analysis; Radiation damage; SEM

Indexed keywords

EID: 24444445793     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200057     Document Type: Article

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