SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 31, Issue 6, 2002, Pages 419-423

Standardless analysis of small amounts of mineral samples by SR-XRF and conventional XRF analyses

(4) D'Angelo, J a,c Perino, E a Marchevsky, E a,c Riveros, J A b,c

a UNIVERSIDAD NACIONAL DE SAN LUIS (Argentina)

b UNIVERSIDAD NACIONAL DE CÓRDOBA (Argentina)

c Depto de Farmacologia de las F (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; SYNCHROTRON RADIATION;

ANALYTICAL RESULTS; ELEMENTAL CONCENTRATIONS; INTENSITY REDUCTION; MASS THICKNESS; MINERAL SAMPLES; SMALL SAMPLES; STANDARDLESS ANALYSIS; SYNCHROTRON RADIATION X-RAY FLUORESCENCES;

SUBSTRATES;

EID: 0036434733 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/xrs.597 Document Type: Article

Times cited : (11)

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