Rapid chemical state analysis by a highly sensitive high-resolution PIXE system

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 190, Issue 1-4, 2002, Pages 704-708

  Maeda, K ^a   Hasegawa, K ^b   Hamanaka, H ^b   Maeda, M ^c   Yabuki, S ^a   Ogiwara, K ^a  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b HOSEI UNIVERSITY   (Japan)

^c TOKYO UNIVERSITY OF MARINE SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

High resolution PIXE; In air PIXE; Rapid chemical state analysis; Time resolved annalysis

Indexed keywords

AEROSOLS; CHEMICAL BONDS; PARTICLE BEAMS; SEDIMENTS; SINGLE CRYSTALS; SPECTROMETERS; X RAY ANALYSIS;

PARTICLE INDUCED X-RAY EMISSION (PIXE);

CHEMICAL ANALYSIS;

EID: 0036570179     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01195-8     Document Type: Conference Paper

References (6)