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Volumn 75, Issue 2, 2003, Pages 355-359

Micro X-ray fluorescence imaging without scans: Toward an element-selective movie

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EID: 0037439180     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac025793h     Document Type: Article
Times cited : (38)

References (18)
  • 3
    • 0001320175 scopus 로고    scopus 로고
    • A hard X-ray scanning microprobe for fluorescence imaging and microdiffraction at the advanced photon source
    • Meyer-Ilse W., Warwick T., Attwood D., Eds.; AIP: St. Louis, MO
    • Cai Z.; Lai B.; Yun W.; Ilinski P.; Legnini D.; Maser J.; Rodrigues W. A Hard X-ray Scanning Microprobe for Fluorescence Imaging and Microdiffraction at the Advanced Photon Source. X-ray Microscopy: Proceedings of the Sixth International Conference; Meyer-Ilse W., Warwick T., Attwood D., Eds.; AIP: St. Louis, MO, 2000; Vol. 507, pp 472-477.
    • (2000) X-Ray Microscopy: Proceedings of the Sixth International Conference , vol.507 , pp. 472-477
    • Cai, Z.1    Lai, B.2    Yun, W.3    Ilinski, P.4    Legnini, D.5    Maser, J.6    Rodrigues, W.7
  • 9
    • 0347755715 scopus 로고    scopus 로고
    • Japanese Patent 3049313, 2000
    • Sakurai K.; Eba H. Japanese Patent 3049313, 2000.
    • Sakurai, K.1    Eba, H.2
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.