SCOPUS 정보 검색 플랫폼

Volumn 138-139, Issue 138/3-4,139/1-4, 2002, Pages 265-274

Energy dispersive x-ray spectrometry by microcalorimetry for the SEM

(7) Newbury, Dale a Wollman, David a Nam, Sae Woo a Hilton, Gene a Irwin, Kent a Small, John a Martinis, John a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

Energy dispersive X ray spectrometry; Microanalysis; Microcalorimeter; Scanning electron microscopy; Transition edge sensor

Indexed keywords

CONDUCTANCE; CONFERENCE PAPER; ELECTRON BEAM; ENERGY; FEEDBACK SYSTEM; MEASUREMENT; MICROCALORIMETRY; SCANNING ELECTRON MICROSCOPY; SENSOR; TEMPERATURE DEPENDENCE; X RAY SPECTROMETRY;

EID: 0036317719 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s006040200030 Document Type: Conference Paper

Times cited : (6)

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- Irwin, K.D.¹ Hilton, G.C.² Martinis, J.M.³ Deiker, S.⁴ Bergren, N.F.⁵ Nam, S.W.⁶ Rudman, D.A.⁷ Wollman, D.A.⁸

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- Wollman, D.A.¹ Nam, S.W.² Newbury, D.E.³ Hilton, G.C.⁴ Irwin, K.D.⁵ Bergren, N.F.⁶ Deiker, S.⁷ Rudman, D.A.⁸ Martinis, J.M.⁹

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13
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