Elemental surface analysis at ambient pressure by electron-induced x-ray fluorescence

Review of Scientific Instruments

Volumn 74, Issue 3 I, 2003, Pages 1251-1254

  Feldman, Jason E ^a   Wilcox, Jaroslava Z ^a   George, Thomas ^a   Barsic, David N ^b   Scherer, Axel ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; ELECTRON BEAMS; ELECTRON SOURCES; ENERGY DISPERSIVE SPECTROSCOPY; ION BEAMS;

SURFACE ELEMENTAL ANALYSIS;

FLUORESCENCE;

EID: 0037351843     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542889     Document Type: Article

References (11)

1. E. D. Green and G. S. Kino, J. Vac. Sci. Technol. B 9, 1557 (1991).
2. A. Kelly, U.S. Patent No. 5,391,958 (21 Feb. 1995).
3. T. George, "Pump-less microfabricated electron microscope," NASA New Technology Report NPO-20335, June 1997.
4. G. D. Danilatos, Scanning 7, 1 (1985); Scanning Microsc. 4, 799 (1999).
5. G. D. Danilatos, Scanning 7, 1 (1985); Scanning Microsc. 4, 799 (1999).
6. J. Z. Wilcox, "Simulation of transmissivity of electron beams in Mars atmosphere," JPL Internal Document, 1997.
7. J. Feldman, J. Z. Wilcox, T. George, D. Barsic, and A. Scherer, 13th Lunar and Planetary Science Conference, 1999 (unpublished).
8. D. Joy, Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford University, New York, 1995).
9. R. Browning, T. Eimori, E. P. Traut, B. Chui, and R. Pease, J. Vac. Sci. Technol. B 9, 3578 (1991).
10. R. Reider, H. Vanke, T. Economou, and J. Turkevich, J. Geophys. Res. E 2, 102 (1997).
11. B. L. Doyle, D. S. Walsh, and S. R. Lee, Nucl. Instrum. Methods Phys. Res. B 54, 244 (1991).