Focusing multilayer mirror detection system for carbon K edge soft x-ray absorption spectroscopy (invited)

Review of Scientific Instruments

Volumn 73, Issue 3 II, 2002, Pages 1469-

  Fischer, D A ^a   Sambasivan, S ^a   Kuperman, A ^b   Platonov, Y ^c   Wood, J L ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b DOW CHEMICAL COMPANY   (United States)

^c Osmic Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036494153     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1447585     Document Type: Conference Paper

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