New procedure for intensity and detection limit determination in spectral trace analysis: Application for trace mercury by TXRF

X-Ray Spectrometry

Volumn 31, Issue 4, 2002, Pages 289-295

  Bennun, L ^a   Greaves, E D ^b   Blostein, J J ^a  

^a CENTRO ATÓMICO BARILOCHE   (Argentina)

^b UNIVERSIDAD SIMÓN BOLÍVAR   (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; SIGNAL ANALYSIS; SPECTROSCOPIC ANALYSIS; TRACE ANALYSIS; X RAY DETECTORS;

ANALYSIS OF SIGNAL; DETECTION LIMITS; INTENSITY LIMIT; INTENSITY VALUES; METHOD OF MAXIMUM LIKELIHOOD; PROCESSING PROCEDURES; SIGNAL INTENSITIES; SPECTRAL SIGNAL; TOTAL REFLECTION X-RAY FLUORESCENCE; TRACE MERCURY;

GAMMA RAYS;

EID: 0036325288     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.556     Document Type: Article

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